Engineering Sciences

Subpixel Cross Correlation Registration for High Spatial Resolution Thermal Image on IGBT Emitter Metallization by Thermoreflectance Measurements

Published on - 2023 39th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

Authors: Kociniewski Thierry, Metayrek Youssef, Zoubir Khatir