Engineering Sciences

Subpixel Cross Correlation Registration for High Spatial Resolution Thermal Image on IGBT Emitter Metallization by Thermoreflectance Measurements

Publié le - 2023 39th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

Auteurs : Kociniewski Thierry, Metayrek Youssef, Zoubir Khatir