Published Electric power Robustness Study of SiC MOSFET Under Harsh Electrical and Thermal Constraints Published on 31 December 2013 - CENICS Authors: Mbarek Safa, Pascal Dherbécourt, O. Latry, Francois Fouquet, Othman Dhouha, Mounira Berkani, Stéphane Lefebvre See the publication on HAL Prev. Back to the list Next