Published

Electric power

3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions

Published on - Microelectronics Reliability

Authors: Michele Riccio, Vincenzo D’alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, Stéphane Lefebvre, Philippe Dupuy

See the publication on HAL DOI