Engineering Sciences

Improved Stochastic SPAD Quenching Model Including Build-Up Field Effect

Published on - 2025 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Authors: Rémi Helleboid, Samuel Dahan, Kenzo Morel-Handa, Gabriel Mugny, Isobel Nicholson, Denis Rideau, Marco Pala, Philippe Dollfus, Jérôme Saint-Martin