Electronics

Failure Mechanisms of GaN HEMTs in Single Event Destructive Short-Circuit at Different VDS Voltage Levels

Published on 6 October 2025 - ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025

Authors: Mohamed Lemine Dedew, Stéphane Lefebvre, Tien Anh Nguyen, Thanh Long Le, Valeria Rustichelli, Maroun Alam, Joao Oliveira, Fabio Coccetti