Electric power

Investigation on damaged planar-oxide of 1200V SiC Power Mosfets in non-destructive short-circuit operation

Published on 31 December 2016 - 28th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2017), Sept. 25-28, 2017, Bordeaux (FRANCE)

Authors: François Boige, Frédéric Richardeau, D. Trémouilles, S. Lefebvre, G. Guibaud