Published Engineering Sciences Robustness of SiC JFET in Short-Circuit Modes Published on 31 December 2008 - IEEE Electron Device Letters Authors: N. Boughrara, S. Moumen, S. Lefebvre, Zoubir Khatir, P. Friedrichs, J.-C. Faugieres See the publication on HAL DOI Prev. Back to the list Next
