Published

Materials Science

Preparation and characterization of Fe-Si-B thin films

Published on - 57th DAE Solid State Physics Symposium 2012

Authors: M. Satalkar, S. N. Kane, Alexandre Pasko, A. Apolinário, C. T. Sousa, J. Ventura, J. J. Belo, J. M. Teixeira, J. P. Araujo, F. Mazaleyrat, Etienne Fleury

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Thickness dependence of structural and magnetic properties of Fe 79 Si 8 B 13 films has been studied using magnetic measurements, X-ray diffraction (XRD) and scanning electron microscopy (SEM). Prepared films exhibit the presence of nanocrystalline α-Fe phase embedded in amorphous matrix. Magnetic measurements show their homogeneous nature (within film plane). Direction perpendicular to film plane is the hard direction of magnetization. A cross-sectional SEM measurement provides film thickness. SEM also reveals the granular structure of the films.