Microelectronics
Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices
Microelectronics Reliability -
Affichage des publications 3531 à 3540 sur 4022 au total
Microelectronics
Microelectronics Reliability -
Engineering Sciences
COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering -
Engineering Sciences
European Physical Journal: Applied Physics -
Engineering Sciences
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control -
Electric power
29th IEEE EMBC -
Electric power
IEEE International symposium on Power electronics -
Engineering Sciences
SSD Conference -
Library and information sciences
IEEE Transactions on Signal Processing -