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Publications

Affichage des publications 21 à 30 sur 4046 au total

Image Processing

HYPERPICO : Une approche instrumentale et méthodologique avancée dédiée à la conservation préventive

In the face of climate change and the need for an energy transition toward greater sustainability, the diagnostic tools available for preventive conservation—particularly in historic residences and exhibited collections—are becoming increasingly…

Julie Fromager, Stephane Serfaty, Vincent Detalle, Loïc Martinez, Danilo Forleo

Colloque international SFIIC 2026 : Approches non invasives d'étude et de recherche pour la conservation du patrimoine -

Modeling and Simulation

AI surrogate models for lifetime prediction in power electronic modules

Reliability assessment of power electronic modules (PEMs) traditionally relies on counting methods to decompose complex mission profiles (MPs) into equivalent loading cycles, followed by a cumulative damage rule to estimate fatigue life. While…

M. Ghrabli, Emanuel Aldea, Mounira Bouarroudj, Ludovic Chamoin

Microelectronics Reliability -

Automatic

ADRC-based dual-loop control and stability analysis of stacked interleaved DC–DC buck converter for hydrogen production using PEM electrolyzer

Hydrogen production via water electrolysis, particularly using Proton Exchange Membrane (PEM) electrolyzers, is a key technology for advancing renewable energy integration. Ensuring a stable and efficient supply requires DC–DC converters capable of…

Nada Chhab, Abdelmajid Abouloifa, Elhoussin Elbouchikhi, Azeddine Houari, Ibtissam Lachkar

Energy Reports -

Computer Science

An anomaly-aware detection head for frugal and robust Infrared Small Target Detection

Infrared Small Target Detection (IRSTD) is a challenging task in defense applications, where complex backgrounds and tiny target sizes often result in numerous false alarms using conventional object detectors. To overcome this limitation, we propose…

Alina Ciocarlan, Sylvie Le Hégarat-Mascle, Sidonie Lefebvre

Engineering Applications of Artificial Intelligence -

Microelectronics

Failure mechanisms of GaN HEMTs in single event destructive short-circuit at different VDS voltage levels

In this work, the short-circuit (SC) robustness of 650 V normally-off SP-GaN HEMTs is investigated. The devices under test (DUTs) were subjected to single-event destructive SCs at different drain-source voltage levels. Overall, the DUTs exhibited a…

M.L. Dedew, Stéphane Lefebvre, T.A. Nguyen, T.L. Le, V. Rustichelli, J. Oliveira, M. Alam, J.P. Fradin, A. Marie, F. Coccetti

Microelectronics Reliability -

Signal and Image processing

Learning-based probabilistic subarray switching for robust low-cost interferometric imaging

Computational cost poses a significant challenge in next-generation interferometric imaging systems. In these systems, the large number of antennas makes it impractical to process all measurements simultaneously due to computational capacity…

Jianhua Wang, Mohammed Nabil El Korso, Lucien Bacharach, Pascal Larzabal

IEEE Transactions on Computational Imaging -