Main issues and limitations in Power cycling tests for future integrated power converters

The paper describes accelerated DC and PWM power cycling tests. It presents basic principle of such ageing tests. The required conditions for accelerated testing are discussed and the lifetime prediction method with the main usual difficulties for such ageing tests is detailed. It also focuses on problems caused by introduction of wide band gap power chips in power modules due to the higher operating temperature and power density that are allowed by these devices. Power cycling tests, wide band gap power modules, thermo sensitive electrical parameters,