Electronics
Effect of die metallization layer ageing in the case of power semiconductor devices
European Journal of Electrical Engineering -
Affichage des publications 3141 à 3150 sur 4021 au total
Electronics
European Journal of Electrical Engineering -
Electric power
ECCE 2011 - IEEE Energy Conversion Congress and Exposition: Energy Conversion Innovation for a Clean Energy Future -
Electric power
Microelectronics Reliability -
Computer Vision and Pattern Recognition
ORASIS - Congrès des jeunes chercheurs en vision par ordinateur -
Electric power
IREED 2011 -
Image Processing
Sixth International Conference on Computer Vision Theory and Applications (VISAPP'11) -
Engineering Sciences
Anglo-French Phys. Acoust. Conf. 2011 (AFPAC'11). -
Microelectronics
Sensors and Actuators B: Chemical -
Biophysics
Physical Chemistry Chemical Physics -
Engineering Sciences
European Journal of Electrical Engineering -